IEEE 1445-2016 PDF
$41.00
IEEE Standard for Digital Test Interchange Format (DTIF)
IEEE , 01/27/2017
IEEE 1445-2016 PDF
This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).
This standard is to be used as the standard definition of DATPG output formats and informational content.
Revision Standard – Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
Related products
